Semicon West被譽為北美地區(qū)最具影響力的半導體展會，吸引全球頂尖的半導體廠商、研究機構和專家人士，展示前沿創(chuàng)新技術與應用，推動產業(yè)鏈交融碰撞，已成為全球半導體企業(yè)重要的技術交流平臺、匯聚地和風向標。

Semicon West 2024將于7 月 9—11日在舊金山莫斯康中心舉辦。作為半導體測試領域的領導者，SPEA當然不會缺席。我們將在南大廳 965 號展位展示創(chuàng)新產品（DOT800多核混合信號測試儀、DOT800T功率半導體測試儀）。

期待大家蒞臨交流，共同探討行業(yè)的未來發(fā)展，攜手開啟新的合作篇章。

DOT800——賦能提升測試效率

Visitorsto the SPEA booth will have the opportunity to experience the future of testingwith the SPEA Device Oriented Tester (DOT) platform. This revolutionarymixed-signal tester leverages a unique “tester-in-a-board” concept, integratingall test resources onto a single board. This simplifies connections betweentester channels and devices under test, streamlining the entire testingprocess.

到訪SPEA展位的觀眾，將有機會現場接觸SPEA 面向設備的測試儀 (DOT800) 。這款革命性的混合信號測試儀運用獨特的“板上測試儀”概念，將所有測試資源集成到一塊板上。這簡化了測試儀通道和被測設備之間的連接，從而簡化整個測試過程。

TheDOT’s multi-processor, multi-function channel architecture seamlessly combinesanalog, digital, and signal processing capabilities. This includes multiplecontrol CPUs, DSP modules, and programmable logic units. The modular andconfigurable design allows for the inclusion of an on-board controller and upto four channel cards, enabling customization to perfectly match individualtesting requirements.

DOT800測試儀的多處理器、多功能通道架構將模擬、數字和信號處理能力無縫銜接。它包括多個控制CPU、DSP模塊和可編程邏輯單元。模塊化和可配置的設計允許包含一個板載控制器和最多四個通道卡，賦能定制化、個性化測試需求。

Eachchannel card boasts a dedicated matrix card, further simplifying load boarddesign and reducing relay usage. SPEA’s DOT platform eliminates the need formultiple instruments of different types, allowing for a system comprised ofidentical, replicable instruments. This significantly reduces systemcomplexity, simplifies programming and maintenance, and ensures exceptionaldevice test coverage.

每個通道卡都擁有專用的矩陣卡，進一步簡化了負載板設計，并減少了繼電器的使用。SPEA 的 DOT 800消除對多種不同類型儀器的需求，從而允許由相同的、可復制的儀器組成一套系統。它能顯著降低了系統復雜性，簡化編程和維護，確保出色的測試覆蓋率。

DOT800T——功率半導體測試綜合解決方案

SPEAwill also be showcasing its DOT800T platform, a comprehensive solution forpower semiconductor testing. This versatile platform integrates all necessaryresources for performing ISO, AC, and DC tests on a wide range of powerapplications within a single machine. Designed specifically for testingtraditional silicon devices alongside cutting-edge Gallium Nitride and SiliconCarbide technologies, the DOT800T boasts industry-leading voltage and currentsource capabilities, along with high-frequency and low-current measurementprecision.

SPEA 還將展示 DOT800T ，它是一套滿足功率半導體測試的綜合解決方案。該多功能測試儀將全范圍功率應用中進行 ISO、AC、DC 測試所需的所有資源集成到一套設備中。專為測試傳統硅器件以及氮化鎵和碳化硅技術而設計，DOT800T擁有業(yè)界領先的電壓和電流源功能，以及高頻、低電流量測精度。

TheDOT800T’s multi-core architecture facilitates accurate execution of static,dynamic, and isolation tests across dedicated stations, each equipped with anindependent controller. Multiple test programs can be run concurrently inasynchronous mode, with each core controller managing its own resources,instrument connections, and test program execution.

DOT800T的多核架構有助于跨專用站準確執(zhí)行靜態(tài)、動態(tài)和隔離測試，每個專用站都配備獨立的控制器。多個測試程序能以異步模式同時運行，每個核心控制器管理自己的資源、儀器連接和測試程序執(zhí)行。